Last updated: 28/03/2025

Growth Facilities
    UHV MBE/sputter

Nanofabrication
    Photolithography

Characterisation
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    Probe station
    MOKE
    SPM

 

Scanning Probe Microscope (SPM)

nanoscan VLS-80

MFM
This SPM system is made by nanoscan and have the following capabilities:
  • Modes: atomic force microscope (AFM) & magnetic force microscope (MFM)
  • In-plane magnetic field: -5.5 ~ +5.5 kOe
  • Perpendicular magnetic field: -2.0 ~ +2.0 kOe
  • Stage temperature: room temperature
. This system was purchased by JST-CREST grant.